Vibration monitoring on very sensitive equipment, e.g. electron microscopes and photolithography equipment, in microelectronics and nanotechnology
Evaluation of vibrations according to VC and nano criteria
Sound pressure level analysis with acoustic weightings
Long-term monitoring with alarm function
Two cursors for displaying frequency and amplitude with snap function
Up to four signals in one window
By means of the clone function, up to four VM-OCT+ with different settings can measure simultaneously
External signaling devices can be controlled
Offline measurement possible
